CEDAR: Modeling impact of component error derating and read frequency on system-level vulnerability in high-performance processors

Reliability of the current microprocessor technology is seriously challenged by radiation-induced soft errors. Accurate Vulnerability Factor (VF) modeling of system components is crucial in designing costeffective protection schemes in high-performance processors. Although Statistical Fault Injection (SFI) techniques can be used to provide relatively accurate VF estimations, they are often very time-consuming. Unlike SFI techniques, recently proposed analytical models can be used to compute VF in a timely fashion. However, VFs computed by such models are inaccurate as the system-level impact of soft errors